Bruker DII Phaser XRD


Place: ISIS 2.20

Technical charachteristics:

  • Geometry:                         Theta/Theta
  • Max. useable angular range:        -3 to 160° 2theta
  • Accuracy:                          ±0.02°
  • Achievable peak width:               <0.05°
  • Alignement:                       not needed, factory aligned
  • X-ray wavelength:              Cu, standard ceramic selected tube
  • X-ray generation:               30 kV/10 mA
  • Radiation level:                  <<1mSv/h
  • Detector:                           1-dimentional LYNXEYE
  • Sample motion:                  spinner
  • Instrument type:                        portable, desktop
  • Exterior dimension:             61x60x70 cm
  • Weight:                             95kg
  • Power supply:                    90-250V
  • External cooling water supply: None
  • Computer:                         Built in, addition PC connected with LAN
  • Interface:                          2 USB and 1 LAN


The DIFFRAC.SUITE software package - provides wide opportunities of automated pre-processing of powder diffraction data collected on a Bruker diffractometer and qualitative and quantitative phase analysis; clarification of some of the structural characteristics of the material, such as unit cell parameters, etc.

The Bruker TOPAS software is a powerful way of full-profile analysis by the Rietveld method, which allows specifying the structure of known substances as well as solving and refining structures of the new compounds and minerals according to the powder diffraction data.